E-mail yshiue@sinica.edu.tw Office IRBST 6B14 Tel. of office +886-2-2787-3227 Laboratory IRBST B2B06 Tel. of Lab. +886-2-2787-3228
Education
B.S., 1991, National Taiwan University, Taiwan
Ph.D., 1998, Rutgers University, USA
Experience
Postdoctoral Associate, Rutgers University (1998–2000)
Research Associate, Rutgers University (2000-2002)
Associate Research Scientist, Institute of Physics, Academia Sinica (2005–2010)
Sr. Staff Scientist, IoP & DAAIS, Academia Sinica (2010–2023)
Joint Appointment Sr. Staff Scientist, IAMS, Academia Sinica (2021–2023)
Sr. Staff Scientist, IAMS & DAAIS, Academia Sinica (2023–)
Research Interests
Instrumentation & Electron microscopy
Honors, Awards, and Recognitions
Selected Publications
J. Shiue* and P.-C. Kuo,“Deep-patterning of complex oxides by focused ion beam with PMMA assisted hybrid protective layer", Nano Express, 1, 020032 (2020).
Y. Yusuf, J. Massiot, Y.-T. Chang, P.-H. Wu, V. Yeh, P.-C. Kuo, J. Shiue*, and T.-Y. Yu*, "Optimization of the production of covalently circularized nanodiscs and their characterization in physiological conditions", Langmuir 34(11), 3525-3532 (2018).
P.-C. Kuo, I.-H. Chen, C.-T. Chen, K.-P. Lee, C.-W. Chen, C.-C. Lin, S. W.-Y. Chiu, Y.-F. Hsieh, Y.-L. Wang, J. Shiue*, 2013, “On-chip thin film Zernike phase plate for in-focus transmission electron microscopy imaging of organic materials”, ACS Nano, 7, 465-470 (2013).
J. Shiue* and S.-K. Hung, "A TEM phase plate loading system with loading monitoring and nano-positioning functions", Ultramicroscopy, 110, 1238-1242 (2010).
